Scanning Electron Microscopy SEM

Scanning Electron Microscopy is an important tool in many aspects of product and process development.

Scanning Electron Microscopy SEM is an important tool utilized to understand many of the aspects of product and process development, including the role of excipients in granulation and agglomeration processes, optimizing milling and micronizing operations, and acquiring a basic knowledge of microstructure and morphology. Scanning Electron Microscopy SEM is also used in the process of failure analysis.

The Scanning Electron Microscopy SEM is a type of electron microscope that produces images of the sample surface by scanning it with a high-energy beam of electrons.

Please request a quote or contact us to find out how Exova's Scanning Electron microscopy services can assist you.

Scanning Electron Microscopy SEM and related Microscopy Services include:

Imaging by Scanning Electron Microscopy SEM (secondary or backscatter)
Elemental composition (point mapping and line-scan profiling) using Scanning Electron Microscopy SEM combined with Energy Dispersive X-ray spectroscopy (EDS)
Bulk analysis of elemental composition using EDS/XRF
Digital Image analysis
Morphology and elemental analysis for non-solids by cryo-SEM
Imaging by light microscopy: transmitted, reflected or polarized light phase contrast, Nomarski (DIC)
Optical properties including refractive index, birefringence, sign of elongation, retardation, etc.
Analytical support to Micronization and milling studies
Contaminant investigation
Environmental effects on materials and failure analysis or prediction